The CAMSIZER X2 is a powerful, extremely versatile particle size and shape analyzer with a wide measuring range that combines state-of-the-art camera technology with flexible dispersion options.

„Size“ is only defined unambiguously for spherical particles: the diameter is identical in all directions and orientations. For non-spherical particles, however, the dimensions can vary strongly, depending on the orientation and direction of measurement. Traditional sieve analysis, for example, separates particles on a wire mesh sieve stack with different aperture sizes into fractions.

The smallest possible sieve aperture that a particle can pass is defined by the particle’s smallest projection area. Hence, sieve analysis measures particles in a preferential orientation and provides information which is mostly based on the width of the particle. Particle size analysis with Laser Diffraction (LD) relates all measuring data to the diameter of a spherical particle model. Only dynamic image analysis offers different size definitions which can be ascertained simultaneously. This makes the results comparable to those obtained with other techniques.

The outstanding strength of DIA is the possibility to measure width and length of a particle and to provide a size distribution based on these parameters. The particle width (red curve) can easily be compared to sieve analysis results.