Accurate particle size and zeta potential analyzer ideal for characterizing materials across the widest concentration range.

OVERVIEW

Featuring an enhancement to traditional DLS, the Nanotrac Wave II employs Reference Beating, which amplifies the signal back to the photodector, producing unparalleled accuracy for measuring particle size, zeta potential, molecular weight, and concentration of colloidal systems. The Nanotrac Wave II provides user with superior particle analysis capability by taking advantage of an enhanced optical signal, innovative probe technology, and advanced algorithms. Whether your material is ppm or near finished product, the Wave II obtains fast, sensitive, and precise measurements of materials ranging from sub-nanometer to several microns.

Reference Beating increases the optical signal anywhere from 100 to 1,000,000 times compared to traditional DLS. The increased optical signal enables users to accurately measure single and multi-mode distributions across the widest concentration range in the market. Dubbed appropriately, the Microtrac Way, check out this short presentation to learn more about our proprietary technology.

OPERATION

Reference beating – strongest optical signal…accuracy at lowest concentrations All DLS measurements use a form of “Beating” to strip away the high optical frequency from the scattered light, leaving the particle motion-induced lower frequencies required for size analysis. Microtrac’s heterodyne detection principle uses the probe to collect 180° backscattered light mixed with incident light. This geometry also gathers light reflected from the interface and combines it with collected scattered light. The reflected light enables Reference beating. The total optical signal is amplified by the high intensity of the reflected component. Result: highest possible optical signal providing accurate measurements in the lowest possible concentrations.

SPECIFICATIONS

Enhanced optical signal for superior accuracy compliments of Reference Beating – available only from Microtrac
Unique probe design, fixed optics, and 180° backscatter collection enables fast and precise measurement across the widest concentration range – from ppm to near solids (40 %)
Measures particles ranging in size from 0.3 to 10,000 nanometers
No “A priori” or advance knowledge of the particle size distribution is required
Able to measure Zeta Potential closer to iso-electric point by eliminating errors caused by electro-osmotic flow. ZP measurement ranges from -200 to +200mV
User selectable data presentation modes

Distribution – standard volume particle size distribution
Legacy – ensure data consistency when transitioning from “legacy” instrument
Mode – simultaneously measure size and concentration.

Removable sample cell – available in Teflon or stainless steel
150 µl sample volume required – ideal for high dollar materials
Peltier temperature control device
Multiple flow cell options – ability to connect a titrator.

DOWNLOADS & RESOURCES

Advantages of the Frequency Power Spectrum Method