- PRODUCTS
-
SECTORS
- Automotive
- Biotechnology
-
Chemistry
- Particle Size Analysis
- Particle Size and Shape Analysis
- Zeta Potential Analysis
- Stability and Shelf Life Analysis
- Surface Area and Pore Size Distribution
- Density measurement
- Catalyst Analysis
- Crystallization Analysis
- Raw Materials ID & Verification
- Quantitative Analysis
- Process Control
- Dispersed Particle Surface Area Analysis
- Micro CT 3D Imaging
- SEM Imaging
-
Coatings
- Particle Size Analysis
- Particle Size and Shape Analysis
- Zeta Potential Analysis
- Stability and Shelf Life Analysis
- Dispersed Particle Surface Area Analysis
- Surface Area and Pore Size Distribution
- Density measurement
- Catalyst Analysis
- Crystallization Analysis
- Raw Materials ID & Verification
- Quantitative Analysis
- Process Control
- Micro CT 3D Imaging
- SEM Imaging
- Environmental
- Fertilizers
-
Food & Beverages
- Particle Size Analysis
- Particle Size and Shape Analysis
- Zeta Potential Analysis
- Stability and Shelf Life Analysis
- Surface Area and Pore Size Distribution
- Density measurement
- Crystallization Analysis
- Raw Materials ID & Verification
- Quantitative Analysis
- Process Control
-
Dispersed Particle Surface Area Analysis
- Micro CT 3D Imaging
- SEM Imaging
-
Materials Science
- Particle Size Analysis
- Particle Size and Shape Analysis
- Zeta Potential Analysis
- Stability and Shelf Life Analysis
- Surface Area and Pore Size Distribution
- Density measurement
- Catalyst Analysis
- Crystallization Analysis
- Raw Materials ID & Verification
- Quantitative Analysis
- Process Control
- Dispersed Particle Surface Area Analysis
- Micro CT 3D Imaging
- SEM Imaging
- Mining & Minerals
-
Petrochemicals
- Particle Size Analysis
- Particle Size and Shape Analysis
- Zeta Potential Analysis
- Stability and Shelf Life Analysis
- Surface Area and Pore Size Distribution
- Density measurement
- Catalyst Analysis
- Crystallization Analysis
- Raw Materials ID & Verification
- Quantitative Analysis
- Process Control
- Dispersed Particle Surface Area Analysis
- Micro CT 3D Imaging
- SEM Imaging
-
Pharmaceuticals
- Particle Size Analysis
- Particle Size and Shape Analysis
- Zeta Potential Analysis
- Stability and Shelf Life Analysis
- SEM Imaging
- Micro CT 3D Imaging
- Crystallization Analysis
- Surface Area and Pore Size Distribution
- Density measurement
- Raw Materials ID & Verification
- Quantitative Analysis
- Process Control
- Biosafety Enclosures
- Glove Integrity Testing
- Aerodynamic Particle Sizer
- Catalyst Analysis
- Dispersed Particle Surface Area Analysis
-
Polymers and Plastics
- Particle Size Analysis
- Particle Size and Shape Analysis
- Zeta Potential Analysis
- Stability and Shelf Life Analysis
- Surface Area and Pore Size Distribution
- Density measurement
- Catalyst Analysis
- Crystallization Analysis
- Raw Materials ID & Verification
- Quantitative Analysis
- Process Control
- Dispersed Particle Surface Area Analysis
- Micro CT 3D Imaging
- SEM Imaging
- Security
-
Others
- Particle Size Analyzers
- Particle Size and Shape Analysis
- Zeta Potential Analysis
- Stability and Shelf Life Analysis
- Surface Area and Pore Size Distribution
- Density measurement
- Catalyst Analysis
- Quantitative Analysis
- Process Control
- Filter Testing
- Containment Enclosures
- Dispersed Particle Surface Area Analysis
- Micro CT 3D Imaging
- SEM Imaging
-
APPLICATIONS
- Particle Characterization
- Stability and Shelf Life Analysis
- Surface Area and Pore Size Distribution
- Catalyst Analysis
- Density measurement
- Crystallization Analysis
- Imaging
- Biosafety
- Process Control
- Raw Materials Identification
- Aerosol Characterization
- Filter Testing
- Airport Security
-
MANUFACTURERS
- Agilent
- Flow Sciences
- Galaxy Scientific
- Mageleka
- Microtrac
- NeoScan
- Oxford Lasers
- Semplor
- Technobis
- Tema Sinergie
- Tornado Spectral Systems
- TSI
-
SECTORS
- SERVICES & SUPPORT
- NEWS & EVENTS
- ABOUT
- CONTACT
- Home /
- Products /
- TSI - 3788
TSI's N-WCPC Model 3788 is designed for investigators interested in detecting the smallest nanoparticles. This sophisticated particle counter uses state-of-the-art, water-based condensation technology and features the highest activation energy and lowest detectable particle size of the WCPC family.
PRODUCT DETAILS
TSI's N-WCPC Model 3788 is designed for investigators interested in detecting the smallest nanoparticles. This sophisticated particle counter uses state-of-the-art, water-based condensation technology and features the highest activation energy and lowest detectable particle size of the WCPC family. With less than 0.1 second rise time, the Model 3788 is the fastest CPC commercially available and its high sample flow rate provides low diffusion losses and low Poisson noise. Other important elements include a thermodynamically optimized growth region and enhanced optical and detection design for impressive signal-to-noise ratios. The Model 3788 can be used as a stand-alone counter measuring up to 400,000 particles/cm 3 (using single particle counting) or as a component of a TSI SMPS spectrometer .
FEATURES AND BENEFITS
- 2.5 nanometer detection
- Single particle counting to 4 x 10 5 particles/cm 3
- < 100 millisecond rise time response
- Sheath flow with high aerosol flow rate for enhanced counting statistics
- Convenient, eco-friendly water as working fluid
- 1⁄10 th second data reporting
- Built-in SMPS™ spectrometer compatibility
- USB flash drive data storage option
- Built in Ethernet capability
- 6" color touch screen with graphical interface
APPLICATIONS
TSI's N-WCPC is suitable for most particle counting applications, but its ability to detect down to 2.5 nanometers, make this WCPC ideally suited for:
- Particle formation and growth studies
- Nanotechnology research or process monitoring
- Inhalation or exposure chamber studies
- Combustion and engine exhaust studies
Learn how to purchase a N-WCPC Model 3788 for less!
RESOURCE CENTER
© Copyright 2017 ATS Elektronik Servis Tic. Ltd. Şti.